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Semiconductor X-ray Inspection HT100L
Semiconductor X-ray Inspection HT100L Semiconductor X-ray Inspection HT100L

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Semiconductor X-ray Inspection HT100L

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Used for detection of LED chips, LED internal bonding wires, LED crystal wires, IC packages, correction bridges, resistors, capacitor connectors, etc.
  • HT100L

  • ELT

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Semiconductor X-ray Inspection--HT100L

HT100L

Equipment overview

Used for detection of LED chips, LED internal bonding wires, LED crystal wires, IC packages, correction bridges, resistors, capacitor connectors, etc.

Functions and Feature

The X-ray tube moves up and down, the flat-panel detector moves up and down and tilts 45°, the XYAxis of the stage moves back and forth, left and right, And the five-axis motion structure allows defects at anylocation in the product to be easily detected.

Technical specifications

文字文稿1_01(14)

X-ray imaging


文字文稿6_01(12)

Note: The above information only represents general descriptions and characteristics, which may change with technological advancement and equipment upgrades. Specific parameters are subject to the final agreement.


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